Library

Title
File
Test method to predict EOS Field returns APE-2011-Pieraerts
Evaluation and Optimization of the Thermal Performance of a Socketed Device for an HTOL Application BiTS-2012-Loiseau
EVM Test Impairments ChipEx-2012-Regev
Scaling Quad-Flat No-Leads Package Performance to E-band Frequencies COMCAS-2013-Regev
A frequency measurement BIST implementation targeting gigahertz application ITC-2012-Dia
Reflection EVM Impairments in Wideband 60GHz and E band designs RFIC-Mini-Symposium-2013-Regev
Reducing Substrate Noise Coupling in a 3D-PICS Integrated Passive Device by localized P+ Guard Rings SiRF-2013-Ben-Salah
A joint innovation Program between Thales, Valeo, SMEs & Research Labs on Mechatronic Devices Reliability APE-2013-Lefebvre
Comprehensive nano-structural study of SSRM nanocontact on silicon ESREF-2011-Delaroque
ESDA: EOS ad hoc WG IEW-2012-Lefebvre
Importance of HAST test socket design to prevent artifactual failure IMAPS-2012-Gautier
Evaluation of digital holography microscopy for roughness control prior wafer direct bonding ISTFA-2011-Delaroque
Scanning Capacitance Microscopy: a valuable tool to diagnose current paths in 3D-capacitors process ISTFA-2012-Delaroque
Test method to efficiently detect 3ppb frequency variation SEMICON-EMTC-2011-DeLedinghen
Simultaneous Measures of Temperature and Expansion on Electronic Compound Semitherm-2011-Gautier
Evaluation of digital holography microscopy for roughness control prior wafer direct bonding ISTFA-2013-Domenges
Weight based Feature Selection Algorithm for Alternative Measurements ETS-2014-Verdy
Over Voltage Stress (OVS) test method applied on an IC IEW-2014-Kamdem
Electrical Overstress robustness and test method for ICs ESDA-2014-Kamdem